POLARIZATION, BAND LINEUPS, AND STABILITY OF SIC POLYTYPES

被引:125
作者
QTEISH, A [1 ]
HEINE, V [1 ]
NEEDS, RJ [1 ]
机构
[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND
来源
PHYSICAL REVIEW B | 1992年 / 45卷 / 12期
关键词
D O I
10.1103/PhysRevB.45.6534
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We calculate the spontaneous polarization of wurtzite-structure SiC, using the recently proposed supercell technique of Posternak, Baldereschi, Catellani, and Resta [Phys. Rev. Lett. 64, 1777 (1990)] and a first-principles pseudopotential approach. The macroscopic polarization is found to be 4.32 x 10(-2) C/m2, and is mainly due to the electronic-charge-density redistribution rather than a relaxation of the positions of the ions. The valence-band offset at the interface between the wurtzite and cubic forms is determined using the same supercell calculations, giving 0.13 eV, with the wurtzite-structure SiC valence-band edge being higher in energy. Our calculations also predict the crystal-field splitting of the top of the valence band of wurtzite-structure SiC to be 0.12 eV, and give some insight into the nature of the dipole created by a single stacking fault. Finally, the effect of the macroscopic electric fields on the relative stability of SiC polytypes is discussed and found to be negligible.
引用
收藏
页码:6534 / 6542
页数:9
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