COMPACT FIELD COLOR SCHLIEREN SYSTEM FOR USE IN MICROGRAVITY MATERIALS PROCESSING

被引：1

作者：

POTEET, WM ^{[1
]}

OWEN, RB ^{[1
]}

机构：

[1] NASA, GEORGE C MARSHALL SPACE FLIGHT CTR, ES 73 SPACE SCI LAB, HUNTSVILLE, AL 35812 USA

来源：

OPTICAL ENGINEERING | 1986年 / 25卷 / 07期

关键词：

D O I：

10.1117/12.7973917

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：841 / 845

页数：5

共 12 条

[1] RAINBOW SCHLIEREN AND ITS APPLICATIONS [J].

HOWES, WL .

APPLIED OPTICS, 1984, 23 (14) :2449-2460

[2] RAINBOW SCHLIEREN VS MACH-ZEHNDER INTERFEROMETER - A COMPARISON [J].

HOWES, WL .

APPLIED OPTICS, 1985, 24 (06) :816-822

[3]

HOWES WL, 1983, NASA TP2166

[4] OPTICAL OBSERVATIONS OF UNIDIRECTIONAL SOLIDIFICATION IN MICROGRAVITY [J].

JOHNSTON, MH ;

OWEN, RB .

METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1983, 14 (10) :2163-2167

[5]

JOHNSTON MH, 1983, NASA TP2110

[6] NEW DIMENSION IN SCHLIEREN TECHNIQUE - FLOW FIELD ANALYSIS USING COLOR [J].

MADDOX, AR ;

BINDER, RC .

APPLIED OPTICS, 1971, 10 (03) :474-&

[7] INTERFEROMETRY AND HOLOGRAPHY IN A LOW-GRAVITY ENVIRONMENT [J].

OWEN, RB .

APPLIED OPTICS, 1982, 21 (08) :1349-1355

[8] OPTICAL MEASUREMENTS AND TESTS PERFORMED IN A LOW-GRAVITY ENVIRONMENT [J].

OWEN, RB .

OPTICAL ENGINEERING, 1981, 20 (04) :634-638

[9]

POTEET WM, 1985, COLOR SCHLIEREN SYST

[10]

Vasilev LA., 1971, SCHLIEREN METHODS

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