STRUCTURE OF SI2N2O

[1] The absorption factor in crystal spectroscopy [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1939, 10 (08) : 221 - 222

[2] CRYSTAL STRUCTURE OF SILICON OXYNITRIDE SI2N2O [J]. NATURE, 1964, 201 (492) : 1211 - +

[3] FORGENG WD, 1958, T AM I MIN MET ENG, V212, P343

[4] CRYSTAL STRUCTURES OF SILICON NITRIDE [J]. NATURE, 1957, 180 (4581) : 332 - 333

[5] THE PROBABILITY DISTRIBUTION OF X-RAY INTENSITIES .2. EXPERIMENTAL INVESTIGATION AND THE X-RAY DETECTION OF CENTRES OF SYMMETRY [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 210 - 214

[6] Reciprocal Lorentz-polarization factor charts for equi-inclination Weissenberg photographs [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1943, 14 (11) : 331 - 335

[7] REFINEMENT OF ATOMIC PARAMETERS OF ALPHA-QUARTZ [J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (06): : 462 - &

[8] Determination of absolute from relative X-ray intensity data [J]. NATURE, 1942, 150 : 151 - 152

[9] 1952, INTERNATIONAL TABLES, V1

[1] The absorption factor in crystal spectroscopy [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1939, 10 (08) : 221 - 222

[2] CRYSTAL STRUCTURE OF SILICON OXYNITRIDE SI2N2O [J]. NATURE, 1964, 201 (492) : 1211 - +

[3] FORGENG WD, 1958, T AM I MIN MET ENG, V212, P343

[4] CRYSTAL STRUCTURES OF SILICON NITRIDE [J]. NATURE, 1957, 180 (4581) : 332 - 333

[5] THE PROBABILITY DISTRIBUTION OF X-RAY INTENSITIES .2. EXPERIMENTAL INVESTIGATION AND THE X-RAY DETECTION OF CENTRES OF SYMMETRY [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 210 - 214

[6] Reciprocal Lorentz-polarization factor charts for equi-inclination Weissenberg photographs [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1943, 14 (11) : 331 - 335

[7] REFINEMENT OF ATOMIC PARAMETERS OF ALPHA-QUARTZ [J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (06): : 462 - &

[8] Determination of absolute from relative X-ray intensity data [J]. NATURE, 1942, 150 : 151 - 152

[9] 1952, INTERNATIONAL TABLES, V1