BRAGG DIFFRACTORS WITH GRADED-THICKNESS MULTILAYERS

被引:25
作者
NAGEL, DJ [1 ]
GILFRICH, JV [1 ]
BARBEE, TW [1 ]
机构
[1] STANFORD UNIV,STANFORD,CA 94305
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 195卷 / 1-2期
关键词
D O I
10.1016/0029-554X(82)90758-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:63 / 65
页数:3
相关论文
共 11 条
  • [1] BARBEE TW, 1981, P TOP C LOW EN XRAY, P131
  • [2] Barlow W.A., 1980, LANGMUIR BLODGETT FI
  • [3] Bertin E.P., 1970, PRINCIPLES PRACTICE
  • [4] GILFRICH JV, 1982, ADV XRAY ANAL, V25
  • [5] GILFRICH JV, 1982, APPLIED SPECTROSCOPY, V36
  • [6] HENKE BL, 1981, P C MONT 1981 NY AM, P85
  • [7] HENKE BL, 1964, ADVANCES XRAY ANALYS, V7, P460
  • [8] X-RAY-DIFFRACTION IN MULTILAYERS
    LEE, P
    [J]. OPTICS COMMUNICATIONS, 1981, 37 (03) : 159 - 164
  • [9] SPILLER E, 1981, P AIP C, P124
  • [10] Underwood J. H., 1979, P SOC PHOTO-OPT INST, V184, P123