X-RAY PHOTOELECTRON STUDY OF SOME SILICON-OXYGEN COMPOUNDS

被引:85
作者
CARRIERE, B
DEVILLE, JP
BRION, D
ESCARD, J
机构
[1] UNIV LOUIS PASTEUR,MINERAL LAB,CNRS,EQUIPE RECH ASSOC 07,F-67070 STRASBOURG,FRANCE
[2] INST NATL RECH CHIM APPL,F-91710 VERTLEPETIT,FRANCE
关键词
D O I
10.1016/0368-2048(77)85006-8
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:85 / 91
页数:7
相关论文
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