SIMPLE GONIOMETER FOR PRECISE GRINDING AND ELECTROPOLISHING OF SINGLE-CRYSTAL SURFACES

被引：14

作者：

WENDELKEN, JF ^{[1
]}

WITHROW, SP ^{[1
]}

FOSTER, CA ^{[1
]}

机构：

[1] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801

来源：

关键词：

D O I：

10.1063/1.1135226

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1215 / 1216

页数：2

共 11 条

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[4]

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[5]

LUSCHER PE, 1975, THESIS NW U

[6]

NOONAN JR, UNPUBLISHED

[7]

WENDELKEN J, TO BE PUBLISHED

[8] HIGH-RESOLUTION LOW-ENERGY ELECTRON DIFFRACTOMETER [J].

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PROPST, FM .

[9]

WENDELKEN JF, 1976, PHYS REV B, V13, P5230, DOI 10.1103/PhysRevB.13.5230

[10]

WENDELKEN JF, 1975, THESIS U ILLINOIS