INTERFERENCE TRANSMISSION FILTERS FOR FAR ULTRAVIOLET

[1] THIN FILMS CALCULATIONS USING THE IBM-650 ELECTRONIC CALCULATOR [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (08) : 813 - 815

[2] REFLECTANCE-INCREASING COATINGS FOR THE VACUUM ULTRAVIOLET AND THEIR APPLICATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (06) : 586 - 597

[3] OPTICS IN THE ORBITING ASTRONOMICAL OBSERVATORY [J]. APPLIED OPTICS, 1962, 1 (02): : 155 - 163

[4] OPTICAL CONSTANTS AND REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM IN VISIBLE AND ULTRAVIOLET [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (07) : 719 - &

[5] REFLECTANCE OF EVAPORATED ALUMINUM IN THE VACUUM ULTRAVIOLET [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (12) : 1009 - 1012

[6] INFLUENCE OF PURITY, SUBSTRATE TEMPERATURE, AND AGING CONDITIONS ON THE EXTREME ULTRAVIOLET REFLECTANCE OF EVAPORATED ALUMINUM [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (12) : 1070 - 1073

[7] HEAVENS OS, 1955, OPTICAL PROPERTIES T, pCH7

[8] EINE NEUE HOCHBRECHENDE SUBSTANZ FUR DIELEKTRISCHE ULTRAVIOLETT-SPIEGEL [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 156 (02): : 117 - 124

[9] HONCIA G, 1960, THESIS TU BERLIN

[10] BESTIMMUNG SCHWACHER ABSORPTIONEN IN DUNNEN DIELEKTRISCHEN SCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 156 (01): : 38 - 54

[1] THIN FILMS CALCULATIONS USING THE IBM-650 ELECTRONIC CALCULATOR [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (08) : 813 - 815

[2] REFLECTANCE-INCREASING COATINGS FOR THE VACUUM ULTRAVIOLET AND THEIR APPLICATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (06) : 586 - 597

[3] OPTICS IN THE ORBITING ASTRONOMICAL OBSERVATORY [J]. APPLIED OPTICS, 1962, 1 (02): : 155 - 163

[4] OPTICAL CONSTANTS AND REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM IN VISIBLE AND ULTRAVIOLET [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (07) : 719 - &

[5] REFLECTANCE OF EVAPORATED ALUMINUM IN THE VACUUM ULTRAVIOLET [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (12) : 1009 - 1012

[6] INFLUENCE OF PURITY, SUBSTRATE TEMPERATURE, AND AGING CONDITIONS ON THE EXTREME ULTRAVIOLET REFLECTANCE OF EVAPORATED ALUMINUM [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (12) : 1070 - 1073

[7] HEAVENS OS, 1955, OPTICAL PROPERTIES T, pCH7

[8] EINE NEUE HOCHBRECHENDE SUBSTANZ FUR DIELEKTRISCHE ULTRAVIOLETT-SPIEGEL [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 156 (02): : 117 - 124

[9] HONCIA G, 1960, THESIS TU BERLIN

[10] BESTIMMUNG SCHWACHER ABSORPTIONEN IN DUNNEN DIELEKTRISCHEN SCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 156 (01): : 38 - 54