DEPTH-PROFILING OF CU-NI SANDWICH SAMPLES BY SECONDARY ION MASS-SPECTROMETRY

被引：82

作者：

HOFER, WO ^{[1
]}

LIEBL, H ^{[1
]}

机构：

[1] EURATOM,MAX PLANCK INST PLASMA PHYS,D-8046 GARCHING,FED REP GER

来源：

APPLIED PHYSICS | 1975年 / 8卷 / 04期

关键词：

D O I：

10.1007/BF00898370

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：359 / 360

页数：2

共 12 条

[1] Bernheim M., 1973, International Journal of Mass Spectrometry and Ion Physics, V12, P93, DOI 10.1016/0020-7381(73)80090-7
[2] Bernheim M., 1973, Radiation Effects, V18, P231, DOI 10.1080/00337577308232127
[3] Carter G., 1972, Radiation Effects, V16, P107, DOI 10.1080/00337577208232028
[4] ION SORPTION IN PRESENCE OF SPUTTERING
CARTER, G
COLLIGON, JS
LECK, JH
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1962, 79 (508): : 299 - &
[5] New studies on the cathode of glow discharge
Guentherschulze, A.
Tollmien, W.
[J]. ZEITSCHRIFT FUR PHYSIK, 1942, 119 (11-12): : 685 - 695
[6] Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700
[7] Hermanne N., 1973, Radiation Effects, V19, P161, DOI 10.1080/00337577308232237
[8] HOFER WO, TO BE PUBLISHED
[9] LIEBL H, 1971, INT J MASS SPECTROM, V6, P407
[10] MECHANISM OF SURFACE MICRO-ROUGHENING BY ION-BOMBARDMENT
SIGMUND, P
[J]. JOURNAL OF MATERIALS SCIENCE, 1973, 8 (11) : 1545 - 1553