APPLICATION OF THE ENERGY-DISPERSIVE X-RAY-DIFFRACTION METHOD TO DETERMINE STATIC AND DYNAMIC DISPLACEMENTS CLOSE TO D IN TA SINGLE-CRYSTALS

被引：6

作者：

STEYRER, G ^{[1
]}

METZGER, TH ^{[1
]}

PEISL, J ^{[1
]}

机构：

[1] UNIV MUNICH,SEKT PHYS,D-8000 MUNICH 22,FED REP GER

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1984年 / 17卷 / FEB期

关键词：

D O I：

10.1107/S0021889884010967

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：33 / 38

页数：6

共 24 条

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