A JOSEPHSON SAMPLER WITH 2.1-PS RESOLUTION

[1] A DIRECT-COUPLED JOSEPHSON SAMPLER [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1983, 22 (07): : L435 - L437

[2] JOSEPHSON-JUNCTIONS OF SMALL AREA FORMED ON THE EDGES OF NIOBIUM FILMS [J]. APPLIED PHYSICS LETTERS, 1980, 37 (02) : 237 - 239

[3] GENERATION AND MEASUREMENT OF ULTRASHORT CURRENT PULSES WITH JOSEPHSON DEVICES [J]. APPLIED PHYSICS LETTERS, 1980, 36 (12) : 1005 - 1007

[4] FARIS SM, 1983, Patent No. 4401900

[5] HARRIS EP, 1979, IEEE T MAGN, V15, P562, DOI 10.1109/TMAG.1979.1060167

[6] ELECTRONICALLY ADJUSTABLE DELAY FOR JOSEPHSON-TECHNOLOGY [J]. ELECTRON DEVICE LETTERS, 1982, 3 (09): : 261 - 263

[7] HIGH CURRENT-DENSITY JOSEPHSON EDGE-JUNCTION CAPACITANCE [J]. PHYSICA B & C, 1981, 108 (1-3): : 983 - 984

[8] MOORE DS, UNPUB

[9] FLUXON OBSERVATION USING A JOSEPHSON SAMPLER [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (08): : L479 - L481

[10] A JOSEPHSON ULTRAHIGH-RESOLUTION SAMPLING SYSTEM [J]. APPLIED PHYSICS LETTERS, 1980, 36 (12) : 1008 - 1010

[1] A DIRECT-COUPLED JOSEPHSON SAMPLER [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1983, 22 (07): : L435 - L437

[2] JOSEPHSON-JUNCTIONS OF SMALL AREA FORMED ON THE EDGES OF NIOBIUM FILMS [J]. APPLIED PHYSICS LETTERS, 1980, 37 (02) : 237 - 239

[3] GENERATION AND MEASUREMENT OF ULTRASHORT CURRENT PULSES WITH JOSEPHSON DEVICES [J]. APPLIED PHYSICS LETTERS, 1980, 36 (12) : 1005 - 1007

[4] FARIS SM, 1983, Patent No. 4401900

[5] HARRIS EP, 1979, IEEE T MAGN, V15, P562, DOI 10.1109/TMAG.1979.1060167

[6] ELECTRONICALLY ADJUSTABLE DELAY FOR JOSEPHSON-TECHNOLOGY [J]. ELECTRON DEVICE LETTERS, 1982, 3 (09): : 261 - 263

[7] HIGH CURRENT-DENSITY JOSEPHSON EDGE-JUNCTION CAPACITANCE [J]. PHYSICA B & C, 1981, 108 (1-3): : 983 - 984

[8] MOORE DS, UNPUB

[9] FLUXON OBSERVATION USING A JOSEPHSON SAMPLER [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (08): : L479 - L481

[10] A JOSEPHSON ULTRAHIGH-RESOLUTION SAMPLING SYSTEM [J]. APPLIED PHYSICS LETTERS, 1980, 36 (12) : 1008 - 1010