360-deg profile noncontact measurement using a neural network

被引:24
作者
Chang, M
Tai, WC
机构
关键词
360-deg profilometry; neural networks; gauge blocks;
D O I
10.1117/12.215483
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new approach to automatic 3-D shape measurement is presented and verified by experiments. This approach, based on neural network theory, can automatically and accurately obtain the profile of diffuse 3-D objects by using a projected laser stripe. When the laser stripe is projected on an object, the line image of the laser light is grasped by a CCD camera. Using neural network theory, a relationship between the laser stripe image in the CCD camera and the related absolute position in space can be established. Thus the spatial coordinates of a measured line image in a CCD camera can be obtained according to the output value of the neural network. By processing a series of laser line images from the discrete angular positions of an object, a complete 3-D profile can be reconstructed. Theoretical analysis and experimental systems are presented. Experimental results show that this approach can determine the 360-deg profile of an object with an accuracy of 0.4 mm.
引用
收藏
页码:3572 / 3576
页数:5
相关论文
共 7 条
[1]  
[Anonymous], 1991, NEURAL NETWORKS
[2]   360-DEG PROFILOMETRY - NEW TECHNIQUES FOR DISPLAY AND ACQUISITION [J].
ASUNDI, AK ;
CHAN, CS ;
SAJAN, MR .
OPTICAL ENGINEERING, 1994, 33 (08) :2760-2769
[3]   TRIANGULATION WITH EXPANDED RANGE OF DEPTH [J].
BICKEL, G ;
HAUSLER, G ;
MAUL, M .
OPTICAL ENGINEERING, 1985, 24 (06) :975-977
[4]   AUTOMATED 360-DEGREES PROFILOMETRY OF 3-D DIFFUSE OBJECTS [J].
HALIOUA, M ;
KRISHNAMURTHY, RS ;
LIU, HC ;
CHIANG, FP .
APPLIED OPTICS, 1985, 24 (14) :2193-2196
[5]   3-DIMENSIONAL INSPECTION USING MULTISTRIPE STRUCTURED LIGHT [J].
JALKIO, JA ;
KIM, RC ;
CASE, SK .
OPTICAL ENGINEERING, 1985, 24 (06) :966-974
[6]  
TANG CW, 1993, P SOC PHOTO-OPT INS, V2101, P122, DOI 10.1117/12.156321
[7]   30 YEARS OF ADAPTIVE NEURAL NETWORKS - PERCEPTRON, MADALINE, AND BACKPROPAGATION [J].
WIDROW, B ;
LEHR, MA .
PROCEEDINGS OF THE IEEE, 1990, 78 (09) :1415-1442