MAXIMUM DIELECTRIC STRENGTH OF THIN SILICON OXIDE FILMS

[1] SCHOTTKY EMISSION THROUGH THIN INSULATING FILMS [J]. PHYSICAL REVIEW LETTERS, 1962, 8 (07) : 267 - &

[2] FLUGGE S, 1956, ENCYCLOP PHYSICS ED, V17, P169

[3] FRANZ W, 1956, ENCYCLOP PHYSICS, V17, P169

[4] KENNEDY DR, 1958, LT374 REPT REF ERA L

[5] KLEIN N, 1964 S PHYS FAIL EL

[6] KLEIN N, PADC SERIES RELIABIL, V3, P315

[7] LENGYEL G, 1963, IEEE T POWER APPARAT, V82, P951

[8] ELECTRON TRANSPORT MECHANISMS IN THIN INSULATING FILMS [J]. PHYSICAL REVIEW, 1962, 128 (05): : 2088 - &

[9] On the dielectric constant and electrical conductivity of mica in intense fields. [J]. PHILOSOPHICAL MAGAZINE, 1916, 32 (187-92) : 112 - 129

[10] Siddall G., 1959, VACUUM, V9, P274

[1] SCHOTTKY EMISSION THROUGH THIN INSULATING FILMS [J]. PHYSICAL REVIEW LETTERS, 1962, 8 (07) : 267 - &

[2] FLUGGE S, 1956, ENCYCLOP PHYSICS ED, V17, P169

[3] FRANZ W, 1956, ENCYCLOP PHYSICS, V17, P169

[4] KENNEDY DR, 1958, LT374 REPT REF ERA L

[5] KLEIN N, 1964 S PHYS FAIL EL

[6] KLEIN N, PADC SERIES RELIABIL, V3, P315

[7] LENGYEL G, 1963, IEEE T POWER APPARAT, V82, P951

[8] ELECTRON TRANSPORT MECHANISMS IN THIN INSULATING FILMS [J]. PHYSICAL REVIEW, 1962, 128 (05): : 2088 - &

[9] On the dielectric constant and electrical conductivity of mica in intense fields. [J]. PHILOSOPHICAL MAGAZINE, 1916, 32 (187-92) : 112 - 129

[10] Siddall G., 1959, VACUUM, V9, P274