DETERMINATION OF THE DETECTION EFFICIENCY OF A CHANNELPLATE ELECTRON MULTIPLIER

被引:27
作者
SAKURAI, T
HASHIZUME, T
机构
关键词
D O I
10.1063/1.1138976
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:236 / 239
页数:4
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共 16 条
[1]   CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE [J].
BRENNER, SS ;
MCKINNEY, JT .
SURFACE SCIENCE, 1970, 23 (01) :88-&
[2]  
GALANTI M, 1971, REV SCI INSTRUM, V42, P1818
[3]   ABSOLUTE AND ANGULAR EFFICIENCIES OF A MICROCHANNEL-PLATE POSITION-SENSITIVE DETECTOR [J].
GAO, RS ;
GIBNER, PS ;
NEWMAN, JH ;
SMITH, KA ;
STEBBINGS, RF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (11) :1756-1759
[4]  
GARUGANTHU RR, 1984, REV SCI INSTRUM, V55, P2030
[5]   SURFACE SEGREGATION OF CU-NI ALLOYS [J].
HASHIZUME, T ;
JIMBO, A ;
SAKURAI, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :818-819
[6]  
Hashizume T., UNPUB
[7]  
KENNERLY RE, 1982, REV SCI INSTRUM, V48, P1682
[8]   AIMING PERFORMANCE OF ATOM PROBE [J].
KRISHNASWAMY, SV ;
MCLANE, SB ;
MULLER, EW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (09) :1237-1240
[9]   REVIEW OF INFLUENCE OF RADIATIONS ON CHANNELTRONS AND CHANNEL PLATES [J].
MACAU, JP ;
JAMAR, J ;
GARDIER, S .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (06) :2049-2055
[10]   PERFORMANCE OF THE NEW HIGH MASS RESOLUTION TIME OF FLIGHT ATOM PROBE [J].
NISHIKAWA, O ;
KURIHARA, K ;
NACHI, M ;
KONISHI, M ;
WADA, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) :810-818