STRUCTURAL STUDIES OF LANGMUIR-BLODGETT MULTILAYERS BY MEANS OF SOFT-X-RAY DIFFRACTION

被引：13

作者：

JARK, W ^{[1
]}

COMELLI, G ^{[1
]}

RUSSELL, TP ^{[1
]}

STOHR, J ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120

来源：

THIN SOLID FILMS | 1989年 / 170卷 / 02期

关键词：

D O I：

10.1016/0040-6090(89)90736-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：309 / 319

页数：11

共 24 条

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