EQUIPPING A 3-CIRCLE SINGLE-CRYSTAL DIFFRACTOMETER WITH AN SI(LI) SOLID-STATE DETECTOR AND A LOW-TEMPERATURE CRYOSTAT (80 K) TO MEASURE X-RAY DIFFUSE INTENSITY

被引：4

作者：

BESSIERE, M

LEFEBVRE, S

CALVAYRAC, Y

BLEY, F

FAYARD, M

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1982年 / 15卷 / FEB期

关键词：

D O I：

10.1107/S0021889882011418

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：94 / 97

页数：4

相关论文

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