POINT-DEFECT CHARGE DETERMINATION BY IONIC POLARIZATION OF SEMICONDUCTING OXIDES WITH SPECIAL REFERENCE TO TIO2-X

被引：4

作者：

KROGER, FA

机构：

[1] Univ of Southern California, Dep of, Materials Science, Los Angeles, CA,, USA, Univ of Southern California, Dep of Materials Science, Los Angeles, CA, USA

来源：

SOLID STATE IONICS | 1985年 / 15卷 / 01期

关键词：

* This work was supported by the United States Department of Energy under Contract No. AS03-76 SF 001113 Project Agreement AT03-76-ER-71027;

D O I：

10.1016/0167-2738(85)90104-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：39 / 41

页数：3