ANALYSIS OF MAGNETIC MULTILAYER ANISOTROPY USING AN ULTRALOW-COMPLIANCE-TORQUE MAGNETOMETER

A torque magnetometer has been designed to make measurements with 0.01-dyn cm resolution. The system was constructed with a Cambridge Technologies 20-nm/dyn-force transducer and was calibrated with a current-carrying coil. A novel analysis technique is presented to determine anisotropy constants in thin-film samples at fields much less than the material's saturating field. Results from a Fe/Cu multilayer sample are reported.