INVESTIGATION AND INTERPRETATION OF ADSORPTION ON SILICON SURFACES

被引：13

作者：

KLEINT, C

机构：

[1] Karl-Marx-Univ Leipzig, Leipzig, East Ger, Karl-Marx-Univ Leipzig, Leipzig, East Ger

来源：

VACUUM | 1986年 / 36卷 / 05期

关键词：

D O I：

10.1016/0042-207X(86)90604-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：267 / 273

页数：7

共 38 条

[1] SURFACE REFLECTANCE SPECTROSCOPY STUDIES OF CHEMISORPTION ON W(100) [J].

ANDERSON, J ;

RUBLOFF, GW ;

PASSLER, MA ;

STILES, PJ .

PHYSICAL REVIEW B, 1974, 10 (06) :2401-2415

[2] INELASTIC SCATTERING OF SLOW ELECTRONS IN SOLIDS [J].

BAUER, E .

ZEITSCHRIFT FUR PHYSIK, 1969, 224 (1-3) :19-&

[3] A STUDY OF THE H-W(110) ADSORPTION SYSTEM BY SURFACE REFLECTANCE SPECTROSCOPY [J].

BLANCHET, GB ;

ESTRUP, PJ ;

STILES, PJ .

PHYSICAL REVIEW B, 1981, 23 (08) :3655-3668

[4] ADSORPTION AND DESORPTION PROPERTIES OF HYDROGEN ON SILICON FILMS AND COMPARISON WITH SINGLE-CRYSTAL PROPERTIES [J].

BRZOSKA, KD ;

KLEINT, C .

THIN SOLID FILMS, 1976, 34 (01) :131-134

[5]

BRZOSKA KD, 1979, PHYS HALBLEITEROBERF, V10, P35

[6]

BRZOSKA KD, 1978, P PHYS HALBLEITEROBE, V9, P95

[7] X-RAY PHOTOEMISSION CROSS-SECTION MODULATION IN DIAMOND, SILICON, GERMANIUM, METHANE, SILANE, AND GERMANE [J].

CAVELL, RG ;

KOWALCZYK, SP ;

LEY, L ;

POLLAK, RA ;

MILLS, B ;

SHIRLEY, DA ;

PERRY, W .

PHYSICAL REVIEW B, 1973, 7 (12) :5313-5316

[8]

ENGLER C, 1980, Z PHYS CHEM-LEIPZIG, V261, P92

[9] EXACT MICROSCOPIC THEORY OF SURFACE CONTRIBUTIONS TO REFLECTIVITY OF A JELLIUM SOLID [J].

FEIBELMAN, PJ .

PHYSICAL REVIEW B, 1976, 14 (02) :762-771

[10] METAL OPTICS NEAR THE PLASMA FREQUENCY [J].

FORSTMANN, F ;

GERHARDTS, RR .

FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1982, 22 :291-323

← 1 2 3 4 →