CRITICAL CURRENT DEGRADATION IN WIDE SAMPLES OF HIGH-FIELD STRIP SUPERCONDUCTORS

被引：6

作者：

HOAG, ED

机构：

来源：

关键词：

D O I：

10.1063/1.1714161

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1183 / &

共 12 条

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