SHORT-TERM STABILITY OF PASSIVE ATOMIC FREQUENCY STANDARDS

[1] BAGLEY AS, 1964, 18 P ANN FREQ CONTR, P344

[2] BAGNALL JJ, NEREM1959 REC, P84

[3] SOME ASPECTS OF THEORY AND MEASUREMENT OF FREQUENCY FLUCTUATIONS IN FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 136 - &

[4] CUTLER LS, 1964, NASA

[5] CUTLER LS, P S DEFINITION MEASU

[6] OPTICALLY PUMPED RUBIDIUM MASER [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 155 - +

[7] A SURVEY OF ATOMIC FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 116 - +

[8] Mockler R.C., 1965, METROLOGIA, V1, P114, DOI [10.1088/0026-1394/1/3/004, DOI 10.1088/0026-1394/1/3/004]

[9] MOCKLER RC, 1960, IRE T INSTRUMENTATIO, VI9, P120

[10] Packard M. E., 1962, IRE T INSTRUM, V1, P215

[1] BAGLEY AS, 1964, 18 P ANN FREQ CONTR, P344

[2] BAGNALL JJ, NEREM1959 REC, P84

[3] SOME ASPECTS OF THEORY AND MEASUREMENT OF FREQUENCY FLUCTUATIONS IN FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 136 - &

[4] CUTLER LS, 1964, NASA

[5] CUTLER LS, P S DEFINITION MEASU

[6] OPTICALLY PUMPED RUBIDIUM MASER [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 155 - +

[7] A SURVEY OF ATOMIC FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 116 - +

[8] Mockler R.C., 1965, METROLOGIA, V1, P114, DOI [10.1088/0026-1394/1/3/004, DOI 10.1088/0026-1394/1/3/004]

[9] MOCKLER RC, 1960, IRE T INSTRUMENTATIO, VI9, P120

[10] Packard M. E., 1962, IRE T INSTRUM, V1, P215