HIGH-PRESSURE RAMAN-STUDY OF THE OPTIC-PHONON MODES IN BEO

被引:18
作者
KOUROUKLIS, GA
SOOD, AK
HOCHHEIMER, HD
JAYARMAN, A
机构
[1] MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
[2] AT&T BELL LABS,MURRAY HILL,NJ 07974
来源
PHYSICAL REVIEW B | 1985年 / 31卷 / 12期
关键词
D O I
10.1103/PhysRevB.31.8332
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:8332 / 8334
页数:3
相关论文
共 16 条
[1]  
[Anonymous], ELECTRONIC STRUCTURE
[2]   DEPENDENCE OF RAMAN FREQUENCIES AND SCATTERING INTENSITIES ON PRESSURE IN GASB, INAS, AND INSB SEMICONDUCTORS [J].
AOKI, K ;
ANASTASSAKIS, E ;
CARDONA, M .
PHYSICAL REVIEW B, 1984, 30 (02) :681-687
[3]   FIRST-ORDER RAMAN EFFECT IN WURTZITE-TYPE CRYSTALS [J].
ARGUELLO, CA ;
ROUSSEAU, DL ;
PORTO, SPS .
PHYSICAL REVIEW, 1969, 181 (03) :1351-&
[4]   OPTICAL FLUORESCENCE SYSTEM FOR QUANTITATIVE PRESSURE MEASUREMENT IN DIAMOND-ANVIL CELL [J].
BARNETT, JD ;
BLOCK, S ;
PIERMARINI, GJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (01) :1-9
[5]  
Born M., 1954, DYNAMICAL THEORY CRY
[6]  
BRAFMAN O, 1971, LIGHT SCATTERING SOL, P284
[7]   THEORETICAL-STUDY OF BEO - STRUCTURAL AND ELECTRONIC-PROPERTIES [J].
CHANG, KJ ;
COHEN, ML .
SOLID STATE COMMUNICATIONS, 1984, 50 (06) :487-491
[8]   DIAMOND ANVIL HIGH-PRESSURE-CELL FOR RAMAN-SPECTROSCOPY [J].
HIRSCH, KR ;
HOLZAPFEL, WB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (01) :52-55
[9]   THE P-T PHASE-DIAGRAM OF OXYGEN DETERMINED BY RAMAN-SCATTERING [J].
HOCHHEIMER, HD ;
JODL, HJ ;
HENKEL, W ;
BOLDUAN, F .
CHEMICAL PHYSICS LETTERS, 1984, 106 (1-2) :79-82
[10]   PRESSURE-INDUCED PHONON FREQUENCY SHIFTS MEASURED BY RAMAN SCATTERING [J].
MITRA, SS ;
BRAFMAN, O ;
DANIELS, WB ;
CRAWFORD, RK .
PHYSICAL REVIEW, 1969, 186 (03) :942-&