APPLICATION OF SPHERICAL NEAR-FIELD MEASUREMENTS TO MICROWAVE HOLOGRAPHIC DIAGNOSIS OF ANTENNAS

被引：27

作者：

RAHMATSAMII, Y ^{[1
]}

LEMANCZYK, J ^{[1
]}

机构：

[1] TECH UNIV DENMARK,INST ELECTROMAGNET,DK-2800 LYNGBY,DENMARK

来源：

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 1988年 / 36卷 / 06期

关键词：

Manuscript received July 15; 1987; revised January 13; 1988. This work was supported in part by the National Aeronautics and Space Administration and in part by the European Space Agency. Y; R ahmat-Samii is with the Jet Propulsion Laboratory; California Institute of Technology; Pasadena; CA 91109. J. Lemanczyk is with the Electromagnetics Institute; Technical University of Denmark; DK-2800; Lyngby; Denmark. IEEE Log Number 8821105;

D O I：

10.1109/8.1190

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：869 / 878

页数：10

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