PHOTOMULTIPLIER AND FIELD PROBE STUDIES OF POSITIVE POINT PLANE DISCHARGE DEVELOPMENT IN SF6/N2 MIXTURES

被引:4
作者
CHATTERTON, PA
RODRIGO, H
机构
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1984年 / 19卷 / 01期
关键词
D O I
10.1109/TEI.1984.298734
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:63 / 74
页数:12
相关论文
共 18 条
[1]   BREAKDOWN OF ROD-PLANE GAPS IN SF6 UNDER POSITIVE SWITCHING IMPULSES [J].
ANIS, H ;
SRIVASTAVA, KD .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1982, 101 (03) :537-546
[2]   INFLUENCE OF FIELD NONUNIFORMITY ON BREAKDOWN CHARACTERISTICS OF SULFUR HEXAFLUORIDE [J].
AZER, AA ;
COMSA, RP .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1973, EI 8 (04) :136-142
[3]  
CHATTERTON PA, 1979, 3RD INT S HVE MIL
[4]  
FARISH O, 1977, P C INSULATION DIELE
[5]  
FARISH O, 1979, 3RD INT S HVE MIL
[6]  
Gallimberti I., 1979, Journal de Physique Colloque, V40, pC7/193, DOI 10.1051/jphyscol:19797440
[7]  
GOLDMAN M, 1978, GASEOUS ELECTRONICS, V1, pCH4
[8]  
KURIMOTO A, 1978, IEE C PUB, V165, P324
[9]  
MEEK JM, 1965, ELECTRON LETT, V1, P110
[10]  
NELSON JK, 1982, GASEOUS DIELECTRICS, V3, P68