INTERPRETATION OF LOW-VOLTAGE PHOTOMEASUREMENTS IN METAL-INSULATOR-METAL FILMS

被引：12

作者：

SCHUERME.FL

CRAWFORD, JA

机构：

来源：

APPLIED PHYSICS LETTERS | 1966年 / 9卷 / 08期

关键词：

D O I：

10.1063/1.1754766

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：317 / &

共 11 条

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BRAUNSTE.M ;

PICUS, GS ;

MEAD, CA .

PHYSICAL REVIEW LETTERS, 1965, 14 (07) :219-&

[2] HOT-ELECTRON ATTENUATION IN THIN AL2O3 FILMS [J].

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BRAUNSTEIN, M ;

PICUS, GS .

PHYSICAL REVIEW LETTERS, 1965, 15 (25) :956-+

[3] PHOTO-EFFECTS IN THIN OXIDE FILM SANDWICH STRUCTURES [J].

CHOPRA, KL .

SOLID-STATE ELECTRONICS, 1965, 8 (09) :715-+

[4] THIN OXIDE FILM SANDWICH STRUCTURE PHOTOCELL [J].

CHOPRA, KL ;

BOBB, LC .

PROCEEDINGS OF THE IEEE, 1963, 51 (12) :1784-&

[5]

CRAWFORD JA, 1966, B AM PHYS SOC, V11, P461

[6]

CRAWFORD JA, 1966, AFALTR66136

[7] ATTENUATION LENGTH MEASUREMENTS OF HOT ELECTRONS IN METAL FILMS [J].

CROWELL, CR ;

HOWARTH, LE ;

SPITZER, WG ;

LABATE, EE .

PHYSICAL REVIEW, 1962, 127 (06) :2006-&

[8]

LUCOVSKY G, 1962, B AM PHYS SOC, V7, P399

[9] POTENTIAL BARRIER PARAMETERS IN THIN-FILM AL-AL2O3-METAL DIODES [J].

NELSON, OL ;

ANDERSON, DE .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (01) :77-&

[10] PHOTOVOLTAGE MEASUREMENTS ON AN AL-AL2O3-AL THIN-FILM SANDWICH [J].

SCHUERME.FL .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (05) :1998-&

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