LASER-INDUCED BULK DAMAGE IN SIO2 AT 1.064-MU-M, 0.532-MU-M, AND 0.355-MU-M

被引：76

作者：

MERKLE, LD

KOUMVAKALIS, N

BASS, M

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 55卷 / 03期

关键词：

D O I：

10.1063/1.333136

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：772 / 775

页数：4

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