MEASUREMENT OF PHASE-SHIFT OF PHOTOREFRACTIVE GRATINGS BY A NOVEL METHOD

被引：33

作者：

ZHA, MZ

AMRHEIN, P

GUNTER, P

机构：

[1] Institute of Quantum Electronics, Swiss Federal Institute of Technology, ETH-Hönggerberg

[2] Department of Physics, East China University of Chemical Technology, Shanghai

[3] Institute of Quantum Electronics, Swiss Federal Institute of Technology, ETH-Hönggerberg

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1990年 / 26卷 / 04期

关键词：

D O I：

10.1109/3.53397

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we demonstrate a novel method to measure the phase shift of photorefractive gratings in electrooptic crystals. The electric field dependence of the phase shift has been measured in KNbO3 crystals with different Fe concentrations. We also present some experimental results which show the strong influence of internal photovoltaic fields on the phase shift of the space charge field. © 1990 IEEE

引用

页码：788 / 792

页数：5

共 24 条

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