HIGH-TEMPERATURE OBSERVATION OF TUNGSTEN CATHODE BY FIELD EMISSION MICROSCOPE

被引：9

作者：

OKUYAMA, F

HIBI, T

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1965年 / 4卷 / 05期

关键词：

D O I：

10.1143/JJAP.4.337

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：337 / +

页数：1

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