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THE RELATIVE ALLOY SENSITIVITY FACTOR OF THE PT-CU SYSTEM

被引：12
作者：
LI, CF
LI, RS
机构：
来源：
SURFACE SCIENCE | 1989年 / 208卷 / 1-2期
关键词：
D O I：
10.1016/0039-6028(89)90046-0
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：221 / 231
页数：11
相关论文
共 9 条
[1]   MATRIX EFFECTS IN QUANTITATIVE AUGER ANALYSIS OF DILUTE ALLOYS [J].
HALL, PM ;
MORABITO, JM .
SURFACE SCIENCE, 1979, 83 (02) :391-405
[2]   BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .1. MONTE-CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALS [J].
ICHIMURA, S ;
SHIMIZU, R .
SURFACE SCIENCE, 1981, 112 (03) :386-408
[3]   A SIMPLE BACKGROUND CORRECTION FOR AES PEAK HEIGHT MEASUREMENTS [J].
LABOHM, F .
SURFACE AND INTERFACE ANALYSIS, 1982, 4 (05) :194-196
[4]   QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF THE AU-CU ALLOYS [J].
LI, RS ;
SUN, YZ .
SURFACE SCIENCE, 1987, 191 (03) :339-352
[5]  
Reuter W., 1972, 6 INT C XRAY OPT MIC, P121
[6]  
SEAH MP, 1983, PRACTICAL SURFACE AN, P188
[7]  
STREUBEL P, 1984, SURFACE INTERFACE AN, V2, P48
[8]   THE ELECTRON MEAN FREE-PATH (APPLICABLE TO QUANTITATIVE ELECTRON-SPECTROSCOPY) [J].
TOKUTAKA, H ;
NISHIMORI, K ;
HAYASHI, H .
SURFACE SCIENCE, 1985, 149 (2-3) :349-365
[9]  
WILLIAMS GP, 1983, 3RD NATL C SYNCHR RA
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