THE MEASUREMENT OF POSITION DEPENDENT TRACE-ELEMENT CONCENTRATIONS WITH MICRO-PROTON INDUCED X-RAY-EMISSION

被引：20

作者：

BOS, AJJ

VANDERSTAP, CCAH

VIS, RD

VALKOVIC, V

机构：

来源：

关键词：

D O I：

10.1016/0584-8547(83)80064-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：1209 / 1215

页数：7

共 7 条

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[2] BOS AJJ, 1982, 2ND P INT WORKSH TRA
[3] A PROTON MICROBEAM UNDER CONSTRUCTION
DENOUDEN, JC
BOS, AJJ
VIS, RD
VERHEUL, H
[J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 131 - 133
[4] FOLKMANN F, 1975, J PHYS E SCI INSTRUM, V8, P429, DOI 10.1088/0022-3735/8/6/001
[5] HOUTMAN JPW, 1982, J RADIOANAL CHEM, V70, P191
[6] ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION
JOHANSSON, SAE
JOHANSSON, TB
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03): : 473 - 516
[7] CAPABILITIES OF PROTON-INDUCED X-RAY-FLUORESCENCE IN ANALYTICAL-CHEMISTRY
VIS, RD
VERHEUL, H
[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1975, 27 (02): : 447 - 456