AIDER - ANGLE-OF-INCIDENCE-DERIVATIVE ELLIPSOMETRY AND REFLECTOMETRY

被引：13

作者：

AZZAM, RMA

机构：

[1] UNIV NEBRASKA,COLL MED,MED CTR,DEPT INTERN MED,DIV HEMATOL,OMAHA,NB 68105

[2] UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508

来源：

OPTICS COMMUNICATIONS | 1976年 / 16卷 / 01期

关键词：

D O I：

10.1016/0030-4018(76)90073-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：153 / 156

页数：4

共 17 条

[1]

ABELES F, 1971, PHYSICS THIN FILMS

[2]

BASHARA NM, 1968, P S RECENT DEVELOPME

[3] MODULATED ELLIPSOMETRY FOR BAND STRUCTURE STUDIES OF SOLIDS AND FILMS [J].

BUCKMAN, AB .

SURFACE SCIENCE, 1969, 16 :193-&

[4] ELECTROREFLECTANCE CHANGES IN DIELECTRIC CONSTANTS OF AU AND AG BY MODULATED ELLIPSOMETRY [J].

BUCKMAN, AB ;

BASHARA, NM .

PHYSICAL REVIEW, 1968, 174 (03) :719-&

[5]

BUCKMAN AB, 1968, P S RECENT DEVELOPME

[6] MODULATION ELLIPSOMETRY AND ITS APPLICATION TO STUDY OF ELECTRODE-ELECTROLYTE INTERFACE [J].

CAHAN, BD ;

HORKANS, J ;

YEAGER, E .

SURFACE SCIENCE, 1973, 37 (01) :559-567

[7]

Heavens OS., 1965, Optical Properties of Thin Solid Films, DOI DOI 10.1038/NPHOTON.2012.260

[8] ELECTRODE POTENTIAL SCANNING ELLIPSOMETRIC SPECTROSCOPY - STUDY OF FORMATION OF ANODIC OXIDE FILM ON NOBLE-METALS [J].

HORKANS, J ;

CAHAN, BD ;

YEAGER, E .

SURFACE SCIENCE, 1974, 46 (01) :1-23

[9] PARAMETER-CORRELATION AND COMPUTATIONAL CONSIDERATIONS IN MULTIPLE-ANGLE ELLIPSOMETRY [J].

IBRAHIM, MM ;

BASHARA, NM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (12) :1622-&

[10] MULTIPLE-ANGLE-OF-INCIDENCE ELLIPSOMETRY OF VERY THIN FILMS [J].

JOHNSON, JA ;

BASHARA, NM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (04) :457-&

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