STRUCTURAL CHARACTERIZATION OF TI-SI THIN-FILM SUPERLATTICES

被引：16

作者：

BRASEN, D

WILLENS, RH

NAKAHARA, S

BOONE, T

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 60卷 / 10期

关键词：

D O I：

10.1063/1.337606

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3527 / 3531

页数：5

共 8 条

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[7]

WILLENS RH, UNPUB APPL PHYS LETT

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