HIGH-RESOLUTION ELECTRON-MICROSCOPY OF NANOSTRUCTURED MATERIALS

被引：6

作者：

JOSEYACAMAN, M

机构：

[1] Instituto de Física, Universidad Nacional Autónoma de Mexico Apdo. Postal 20-364, Deleg. Alvaro Obregón, 01000 México, D.F.

来源：

NANOSTRUCTURED MATERIALS | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1016/0965-9773(95)00016-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the present work we discuss some of the applications of High Resolution Electron Microscopy (NREM) to the characterization of the nanophase materials. Some of the principles are discussed and two examples are shown: individual nanosized particles and, secondly, particles which have already coalesced, The state of the complex particles are compared with theoretical predictions.

引用

页码：171 / 178

页数：8

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