PHOTOREFRACTIVE IMAGING OF SEMICONDUCTOR WAFERS

被引：8

作者：

BYLSMA, RB ^{[1
]}

OLSON, DH ^{[1
]}

GLASS, AM ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 13期

关键词：

D O I：

10.1063/1.99218

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1083 / 1085

页数：3

共 10 条

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[8]

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[9] HOLOGRAPHIC STORAGE IN ELECTROOPTIC CRYSTALS .1. STEADY-STATE [J].

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FERROELECTRICS, 1979, 22 (3-4) :949-960

[10] OPTIMAL PROPERTIES OF PHOTOREFRACTIVE MATERIALS FOR OPTICAL-DATA PROCESSING [J].

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