DIGITAL DATA ACQUISITION, DISPLAY AND ANALYSIS OF SIGNALS FROM SURFACES

被引：34

作者：

HARLAND, CJ

VENABLES, JA

机构：

[1] Univ of Sussex, Sch of Mathematical, & Physical Sciences, Brighton,, Engl, Univ of Sussex, Sch of Mathematical & Physical Sciences, Brighton, Engl

来源：

ULTRAMICROSCOPY | 1985年 / 17卷 / 01期

关键词：

D O I：

10.1016/0304-3991(85)90172-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：9 / 19

页数：11

共 23 条

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[2] BATCHELOR DR, UNPUB
[3] FATHERS DJ, 1983, INST PHYS C, V68, P227
[4] VISUALIZATION OF SUBMONOLAYERS AND SURFACE-TOPOGRAPHY BY BIASED SECONDARY-ELECTRON IMAGING - APPLICATION TO AG LAYERS ON SI AND W SURFACES
FUTAMOTO, M
HANBUCKEN, M
HARLAND, CJ
JONES, GW
VENABLES, JA
[J]. SURFACE SCIENCE, 1985, 150 (02) : 430 - 450
[5] NUCLEATION, GROWTH AND THE INTERMEDIATE LAYER IN AG/SI(100) AND AG SI(111)
HANBUCKEN, M
FUTAMOTO, M
VENABLES, JA
[J]. SURFACE SCIENCE, 1984, 147 (2-3) : 433 - 450
[6] HANBUCKEN M, 1983, I PHYS C SER, V68, P135
[7] ACCURATE MICROCRYSTALLOGRAPHY AT HIGH SPATIAL-RESOLUTION USING ELECTRON BACKSCATTERING PATTERNS IN A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE
HARLAND, CJ
AKHTER, P
VENABLES, JA
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (02): : 175 - 182
[8] HARLAND CJ, UNPUB
[9] HARLAND CJ, 1983, I PHYS C SER, V68, P223
[10] HARLAND CJ, 1980, 7TH P EUR C EL MICR, P502

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