LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY IN FUNGUS-NEMATODE INTERACTION

被引：9

作者：

DENBELDER, E ^{[1
]}

BOEKESTEIN, A ^{[1
]}

VANESCH, JWJ ^{[1
]}

THIEL, F ^{[1
]}

机构：

[1] TFDL,DLO,TECH & PHYS ENGN RES SERV,DEPT ELECTRON MICROSCOPY,6700 GW WAGENINGEN,NETHERLANDS

来源：

SCANNING | 1993年 / 15卷 / 01期

关键词：

ARTHROBOTRYS-OLIGOSPORA; NEMATODE-CAPTURING FUNGI; ROOT-KNOT NEMATODE; MELOIDOGYNE; LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY; FREEZE SUBSTITUTION; CRITICAL-POINT DRYING;

D O I：

10.1002/sca.4950150106

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A comparative study has been made of different preparation techniques used for the scanning electron microscope (SEM), with regard to their application to fungus-nematode interaction. The preparation of frozen-hydrated specimens of both healthy and Arthrobotrys-oligospora-infected second-stage larvae of the root-knot nematode (Meloidogyne sp.) is described, and the results are compared with those obtained by critical point-drying and freeze-drying. In all cases the frozen-hydrated specimens consistently showed the best preservation.

引用

页码：37 / 42

页数：6

共 35 条

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