A METHOD FOR MEASURING THE THICKNESS OF THIN BENT FOILS IN TRANSMISSION ELECTRON MICROSCOPY

被引：13

作者：

DELAVIGNETTE, P

VOOK, RW

机构：

来源：

PHYSICA STATUS SOLIDI | 1963年 / 3卷 / 04期

关键词：

D O I：

10.1002/pssb.19630030406

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

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页码：648 / 653

页数：6

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共 8 条

[1] ANOMALOUS ELECTRON ABSORPTION EFFECTS IN METAL FOILS
HASHIMOTO, H
[J]. PHILOSOPHICAL MAGAZINE, 1960, 5 (57): : 967 - &
[2] ELECTRON MICROSCOPE AND DIFFRACTION STUDY OF METAL CRYSTAL TEXTURES BY MEANS OF THIN SECTIONS
HEIDENREICH, RD
[J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (10) : 993 - 1010
[3] A KINEMATICAL THEORY OF DIFFRACTION CONTRAST OF ELECTRON TRANSMISSION MICROSCOPE IMAGES OF DISLOCATIONS AND OTHER DEFECTS
HIRSCH, PB
HOWIE, A
WHELAN, MJ
[J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 252 (1017) : 499 - &
[4] M/llenstedt, 1939, ANN PHYS LPZ, V36, P113
[5] MacGillavry CH, 1940, PHYSICA, V7, P329
[6] SEIMS R, 1962, PHYS STAT SOL, V2, P421
[7] SINGLE-CRYSTAL TIN FILMS
VOOK, RW
[J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1557 - +
[8] YOSHIOKA H, 1957, J PHYS SOC JPN, V12, P628