DISAPPEARANCE OF TOPOGRAPHICAL CONTRAST IN THE BACKSCATTERED ELECTRON IMAGE IN SCANNING ELECTRON-MICROSCOPY

被引：3

作者：

IKUTA, T

机构：

来源：

APPLIED PHYSICS LETTERS | 1983年 / 42卷 / 06期

关键词：

D O I：

10.1063/1.93995

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：533 / 534

页数：2

相关论文

共 5 条

[1] MAGNETIC DOMAIN CONTRAST FROM CUBIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE
FATHERS, DJ
JAKUBOVICS, JP
JOY, DC
[J]. PHILOSOPHICAL MAGAZINE, 1973, 27 (03) : 765 - 768
[2] MAGNETIC DOMAIN CONTRAST FROM FERROMAGNETIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE
IKUTA, T
SHIMIZU, R
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 23 (02): : 605 - 613
[3] Philbert J., 1969, MICRON, V1, P174
[4] MONTE-CARLO TECHNIQUE AS APPLIED TO FUNDAMENTALS OF EPMA AND SEM
SHIMIZU, R
MURATA, K
IKUTA, T
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) : 4233 - &
[5] YAMOMOTO T, 1976, PHILOS MAG, V34, P311