DATA ACQUISITION AND CONTROL OF WAVELENGTH AND ENERGY DISPERSIVE-X-RAY SPECTROMETERS USING A SINGLE MINICOMPUTER

被引：6

作者：

LEYDEN, DE ^{[1
]}

LENNOX, JC ^{[1
]}

机构：

[1] UNIV GEORGIA,DEPT CHEM,ATHENS,GA 30602

来源：

X-RAY SPECTROMETRY | 1976年 / 5卷 / 03期

关键词：

D O I：

10.1002/xrs.1300050307

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：137 / 141

页数：5

共 11 条

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[2]

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[3]

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[4] TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS [J].

GIAUQUE, RD ;

GOULDING, FS ;

JAKLEVIC, JM ;

PEHL, RH .

ANALYTICAL CHEMISTRY, 1973, 45 (04) :671-681

[5] X-RAY SPECTROMETRY FOR PARTICULATE AIR-POLLUTION - QUANTITATIVE COMPARISON OF TECHNIQUES [J].

GILFRICH, JV ;

BURKHALTER, PG ;

BIRKS, LS .

ANALYTICAL CHEMISTRY, 1973, 45 (12) :2002-2009

[6]

KEENAN JA, 1975, AM LAB, V4, P23

[7]

KNIEP TJ, 1972, ANAL CHEM, V44, pA57

[8]

MALMSTADT HV, 1969, DIGITAL ELECTRONICS

[9]

Russ J.C., 1972, XRAY SPECTROMETRY, V1, P119, DOI DOI 10.1002/XRS.1300010308

[10] SWEPT ELECTRON-BEAM RAPID SCAN SPECTROPHOTOMETER - SOME QUALITATIVE ASPECTS [J].

SANTINI, RE ;

MARGERUM, DW ;

MILANO, MJ .

ANALYTICAL CHEMISTRY, 1972, 44 (04) :826-&

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