THEORY OF BEAM-INDUCED CURRENTS IN SEMICONDUCTORS

[1] ABRANOWITZ M, 1964, US NBS APPL MATH SER, V55, pCH9

[2] THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE [J]. SOLID-STATE ELECTRONICS, 1976, 19 (06) : 437 - 445

[3] A MONTE CARLO CALCULATION ON SCATTERING OF ELECTRONS IN COPPER [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (547P): : 855 - &

[4] BRESSE JF, 1972, SCANNING ELECTRON MI, P105

[5] EFFECT OF GRAIN-BOUNDARIES IN SILICON ON MINORITY-CARRIER DIFFUSION LENGTH AND SOLAR-CELL EFFICIENCY [J]. APPLIED PHYSICS LETTERS, 1978, 33 (12) : 1009 - 1011

[6] DAVIS PJ, 1967, NUMERICAL INTEGRATIO, P99

[7] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5837 - &

[8] Holt D. B., 1974, QUANTITATIVE SCANNIN

[9] HUFF HR, 1977, SEMICONDUCTOR SILICO, pCH8

[10] APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (10) : 537 - 539

[1] ABRANOWITZ M, 1964, US NBS APPL MATH SER, V55, pCH9

[2] THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE [J]. SOLID-STATE ELECTRONICS, 1976, 19 (06) : 437 - 445

[3] A MONTE CARLO CALCULATION ON SCATTERING OF ELECTRONS IN COPPER [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (547P): : 855 - &

[4] BRESSE JF, 1972, SCANNING ELECTRON MI, P105

[5] EFFECT OF GRAIN-BOUNDARIES IN SILICON ON MINORITY-CARRIER DIFFUSION LENGTH AND SOLAR-CELL EFFICIENCY [J]. APPLIED PHYSICS LETTERS, 1978, 33 (12) : 1009 - 1011

[6] DAVIS PJ, 1967, NUMERICAL INTEGRATIO, P99

[7] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5837 - &

[8] Holt D. B., 1974, QUANTITATIVE SCANNIN

[9] HUFF HR, 1977, SEMICONDUCTOR SILICO, pCH8

[10] APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (10) : 537 - 539