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LONG-TERM TRANSIENT RADIATION-RESISTANT GAAS-FETS
被引:4
作者
:
ANDERSON, WT
论文数:
0
引用数:
0
h-index:
0
机构:
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
ANDERSON, WT
[
1
]
SIMONS, M
论文数:
0
引用数:
0
h-index:
0
机构:
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
SIMONS, M
[
1
]
KING, EE
论文数:
0
引用数:
0
h-index:
0
机构:
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
KING, EE
[
1
]
DIETRICH, HB
论文数:
0
引用数:
0
h-index:
0
机构:
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
DIETRICH, HB
[
1
]
LAMBERT, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
LAMBERT, RJ
[
1
]
机构
:
[1]
RES TRIANGLE INST, RES TRIANGLE PK, NC 27709 USA
来源
:
ELECTRON DEVICE LETTERS
|
1982年
/ 3卷
/ 09期
关键词
:
D O I
:
10.1109/EDL.1982.25556
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:248 / 250
页数:3
相关论文
共 6 条
[1]
STABILITY OF PERFORMANCE AND INTERFACIAL PROBLEMS IN GAAS-MESFETS
[J].
ITOH, T
论文数:
0
引用数:
0
h-index:
0
ITOH, T
;
YANAI, H
论文数:
0
引用数:
0
h-index:
0
YANAI, H
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(06)
:1037
-1045
[2]
ITOH T, 1979, I PHYS C SER, V45, P326
[3]
KING EE, 1981, Patent No. 65548
[4]
SUB-MICRON GATE GAAS MESFETS WITH ION-IMPLANTED CHANNELS
[J].
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NOZAKI, T
;
OHATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
OHATA, K
.
JAPANESE JOURNAL OF APPLIED PHYSICS,
1977,
16
:111
-114
[5]
LONG-TERM RADIATION TRANSIENTS IN GAAS-FETS
[J].
SIMONS, M
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
SIMONS, M
;
KING, EE
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
KING, EE
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1979,
26
(06)
:5080
-5086
[6]
TRANSIENT RADIATION STUDY OF GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS IMPLANTED IN CR-DOPED AND UNDOPED SUBSTRATES
[J].
SIMONS, M
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
SIMONS, M
;
KING, EE
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
KING, EE
;
ANDERSON, WT
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
ANDERSON, WT
;
DAY, HM
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
DAY, HM
.
JOURNAL OF APPLIED PHYSICS,
1981,
52
(11)
:6630
-6636
←
1
→
共 6 条
[1]
STABILITY OF PERFORMANCE AND INTERFACIAL PROBLEMS IN GAAS-MESFETS
[J].
ITOH, T
论文数:
0
引用数:
0
h-index:
0
ITOH, T
;
YANAI, H
论文数:
0
引用数:
0
h-index:
0
YANAI, H
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(06)
:1037
-1045
[2]
ITOH T, 1979, I PHYS C SER, V45, P326
[3]
KING EE, 1981, Patent No. 65548
[4]
SUB-MICRON GATE GAAS MESFETS WITH ION-IMPLANTED CHANNELS
[J].
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NOZAKI, T
;
OHATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI,JAPAN
OHATA, K
.
JAPANESE JOURNAL OF APPLIED PHYSICS,
1977,
16
:111
-114
[5]
LONG-TERM RADIATION TRANSIENTS IN GAAS-FETS
[J].
SIMONS, M
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
SIMONS, M
;
KING, EE
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
KING, EE
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1979,
26
(06)
:5080
-5086
[6]
TRANSIENT RADIATION STUDY OF GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS IMPLANTED IN CR-DOPED AND UNDOPED SUBSTRATES
[J].
SIMONS, M
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
SIMONS, M
;
KING, EE
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
KING, EE
;
ANDERSON, WT
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
ANDERSON, WT
;
DAY, HM
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
DAY, HM
.
JOURNAL OF APPLIED PHYSICS,
1981,
52
(11)
:6630
-6636
←
1
→