QUANTITATIVE-ANALYSIS OF TRACE AND MAJOR ELEMENTS IN THIN-SECTIONS OF SOILS WITH THE SECONDARY ION-MICROSCOPE (CAMECA)

被引：8

作者：

BISDOM, EBA

HENSTRA, S

WERNER, HW

BOUDEWIJN, PR

KNIPPENBERG, WF

DEGREFTE, HAM

GOURGOUT, JM

MIGEON, HN

机构：

[1] TECH & PHYS ENGN RES SERV,6700 AJ WAGENINGEN,NETHERLANDS

[2] PHILIPS RES LABS,5600 MD EINDHOVEN,NETHERLANDS

[3] CAMECA,F-92403 COURBEVOIE,FRANCE

来源：

关键词：

D O I：

10.1016/0016-7061(83)90060-5

中图分类号：

S15 [土壤学];

学科分类号：

0903 ; 090301 ;

摘要：

引用

页码：117 / 134

页数：18

共 15 条

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ANDERSEN, CA
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[J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438
[2] Bisdom E. B. A., 1981, Submicroscopy of Soils and Weathered Rocks. 1st Workshop of the International Working-Group on Submicroscopy of Undisturbed Soil Materials (IWGSUSM) 1980, Wageningen, The Netherlands, P117
[3] BISDOM EBA, 1977, NETH J AGR SCI, V25, P1
[4] BISDOM EBA, 1981, NETH J AGR SCI, V29, P23
[5] Henstra S., 1981, Submicroscopy of Soils and Weathered Rocks. 1st Workshop of the International Working-Group on Submicroscopy of Undisturbed Soil Materials (IWGSUSM) 1980, Wageningen, The Netherlands, P55
[6] HENSTRA S, 1980, ELECTRON MICROS, V3, P224
[7] Jongerius A., 1975, 10 NETH SOIL SURV I
[8] KNIPPENBERG WF, 1974, PHILIPS TECH REV, V34, P298
[9] Morgan A. E., 1980, Surface and Interface Analysis, V2, P123, DOI 10.1002/sia.740020402
[10] TEST OF A QUANTITATIVE APPROACH TO SECONDARY ION MASS-SPECTROMETRY ON GLASS AND SILICATE STANDARDS
MORGAN, AE
WERNER, HW
[J]. ANALYTICAL CHEMISTRY, 1977, 49 (07) : 927 - 931