FAST-NEUTRON RADIATION-DAMAGE OF HIGH-PURITY GERMANIUM DETECTORS

被引:33
作者
KRANER, HW
PEHL, RH
HALLER, EE
机构
[1] BROOKHAVEN NATL LAB,UPTON,NY 11973
[2] LAWRENCE BERKELEY LAB,BERKELEY,CA 94720
关键词
D O I
10.1109/TNS.1975.4327633
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:149 / 159
页数:11
相关论文
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