ON THE INFLUENCE OF FREE-CARRIER SCATTERING MECHANISMS ON SEMICONDUCTOR THIN-FILM PLASMA SPECTRA

被引：4

作者：

DEMAKOPOULOU, Y ^{[1
]}

SIAPKAS, D ^{[1
]}

ZHELEVA, NN ^{[1
]}

KUSHEV, DB ^{[1
]}

机构：

[1] CLEMENT OKHRIDSKY UNIV,SEMICOND PHYS & TECHNOL RES LAB,BU-1126 SOFIA,BULGARIA

来源：

INFRARED PHYSICS | 1986年 / 26卷 / 02期

关键词：

D O I：

10.1016/0020-0891(86)90030-8

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：105 / 109

页数：5

共 7 条

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[3] GRIBKOVSKII VP, 1975, THEORY ABSORPTION EM
[4] QUANTUM-THEORY OF THE COMPLEX DIELECTRIC-CONSTANT OF FREE-CARRIERS IN POLAR SEMICONDUCTORS
JENSEN, B
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (09) : 1361 - 1370
[5] ELECTRICAL MODULATION OF MULTIPLE INTERFERENCE IN LAYERED GASE CRYSTALS
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[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 29 (01): : 251 - 257
[6] USE OF PLASMA EDGE REFLECTION MEASUREMENTS IN STUDY OF SEMICONDUCTORS
MOSS, TS
HAWKINS, TDF
BURRELL, GJ
[J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1968, 1 (05): : 1435 - &
[7] Ukhanov Y. I., 1977, OPTICAL PROPERTIES S