ELECTRON-BEAM SENSITIVITY OF ZEOLITE L

被引：60

作者：

TREACY, MMJ

NEWSAM, JM

机构：

来源：

ULTRAMICROSCOPY | 1987年 / 23卷 / 3-4期

关键词：

D O I：

10.1016/0304-3991(87)90252-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：411 / 419

页数：9

共 28 条

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