COMPARISON BETWEEN TI ANOMALOUS X-RAY-SCATTERING FACTORS OBTAINED FROM LAYERED SYNTHETIC MICROSTRUCTURES AND THE DISPERSION RELATIONSHIP

被引：2

作者：

WARBURTON, WK

LUDWIG, KF

BARBEE, TW

机构：

[1] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305

[2] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

[3] STANFORD UNIV,DEPT MAT SCI,STANFORD,CA 94305

来源：

关键词：

D O I：

10.1364/JOSAB.2.000565

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：565 / 567

页数：3

共 5 条

[1] BARBEE TW, 1984, J OPT SOC AM B, V1, P691, DOI 10.1364/JOSAB.1.000691
[2] RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS
CROMER, DT
LIBERMAN, D
[J]. JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) : 1891 - &
[3] CROMER DT, 1970, LASL LA4403 LOS AL S
[4] DETERMINATION OF THE ANOMALOUS SCATTERING FACTORS FOR CU, NI AND TI USING THE DISPERSION-RELATION
HOYT, JJ
DEFONTAINE, D
WARBURTON, WK
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (OCT) : 344 - 351
[5] McMaster W., 1969, UCRL50174 LAWR RAD L