SURFACE CHARACTERIZATION OF AMALGAMS USING X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：26

作者：

HANAWA, T

TAKAHASHI, H

OTA, M

PINIZZOTTO, RF

FERRACANE, JL

OKABE, T

机构：

[1] BAYLOR COLL DENT, DEPT DENT MAT, 3302 GASTON AVE, DALLAS, TX 75246 USA

[2] HOKKAIDO UNIV, SCH DENT, DEPT DENT MAT & ENGN, SAPPORO, HOKKAIDO 060, JAPAN

[3] HOKKAIDO UNIV, FAC ENGN, DEPT ANALYT CHEM L, SAPPORO, HOKKAIDO 060, JAPAN

[4] N TEXAS STATE UNIV, DEPT PHYS, DENTON, TX 76203 USA

来源：

JOURNAL OF DENTAL RESEARCH | 1987年 / 66卷 / 09期

关键词：

D O I：

10.1177/00220345870660091201

中图分类号：

R78 [口腔科学];

学科分类号：

1003 ;

摘要：

引用

页码：1470 / 1478

页数：9

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