TRACE-ELEMENT ANALYSIS BY ION INDUCED X-RAY-EMISSION SPECTROSCOPY

被引：18

作者：

RAITH, B ^{[1
]}

ROTH, M ^{[1
]}

GOLLNER, K ^{[1
]}

GONSIOR, B ^{[1
]}

OSTERMANN, H ^{[1
]}

UHLHORN, CD ^{[1
]}

机构：

[1] RUHR UNIV BOCHUM,INST EXPTL PHYS,D-4630 BOCHUM,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(77)90804-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：39 / 44

页数：6

共 5 条

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BAMBYNEK, W ;

SWIFT, CD ;

CRASEMANN, B ;

FREND, HU ;

RAO, PV ;

PRICE, RE ;

MARK, H ;

FINK, RW .

REVIEWS OF MODERN PHYSICS, 1972, 44 (04) :716-+

[2] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

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GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

[3] SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS [J].

FOLKMANN, F ;

BORGGREEN, J ;

KJELDGAARD, A .

NUCLEAR INSTRUMENTS & METHODS, 1974, 119 (01) :117-123

[4] INNER-SHELL VACANCY PRODUCTION IN ION-ATOM COLLISIONS [J].

GARCIA, JD ;

FORTNER, RJ ;

KAVANAGH, TM .

REVIEWS OF MODERN PHYSICS, 1973, 45 (02) :111-177

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].

JOHANSSON, TB ;

AKSELSSON, R ;

JOHANSSON, SA .

NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+

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