SAMPLING DEPTHS IN TOTAL YIELD AND REFLECTIVITY SEXAFS STUDIES IN THE SOFT-X-RAY REGION

被引：44

作者：

JONES, RG ^{[1
]}

WOODRUFF, DP ^{[1
]}

机构：

[1] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

来源：

SURFACE SCIENCE | 1982年 / 114卷 / 01期

关键词：

D O I：

10.1016/0039-6028(82)90454-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：38 / 46

页数：9

共 12 条

[1] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111)
CITRIN, PH
EISENBERGER, P
HEWITT, RC
[J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312
[2] SEXAFS STUDIES OF IODINE ADSORBED ON SINGLE-CRYSTAL SUBSTRATES
CITRIN, PH
EISENBERGER, P
HEWITT, RC
[J]. SURFACE SCIENCE, 1979, 89 (1-3) : 28 - 40
[3] EXAFS AND SURFACE EXAFS FROM MEASUREMENTS OF X-RAY REFLECTIVITY
FOX, R
GURMAN, SJ
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (11): : L249 - L253
[4] SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE BY MEANS OF PHOTON-STIMULATED ION DESORPTION - O ON MO(100)
JAEGER, R
FELDHAUS, J
HAASE, J
STOHR, J
HUSSAIN, Z
MENZEL, D
NORMAN, D
[J]. PHYSICAL REVIEW LETTERS, 1980, 45 (23) : 1870 - 1873
[5] POSSIBILITY OF ADSORBATE POSITION DETERMINATION USING FINAL-STATE INTERFERENCE EFFECTS
LEE, PA
[J]. PHYSICAL REVIEW B, 1976, 13 (12): : 5261 - 5270
[6] HIGH-VACUUM 2 CRYSTAL SOFT-X-RAY MONOCHROMATOR
LEMONNIER, M
COLLET, O
DEPAUTEX, C
ESTEVA, JM
RAOUX, D
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 152 (01): : 109 - 111
[7] EXAFS IN PHOTOELECTRON YIELD SPECTRA AT K EDGES OF CU, NI, AND GE
MARTENS, G
RABE, P
TOLKIEHN, G
WERNER, A
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 55 (01): : 105 - 108
[8] EXAFS IN PHOTOELECTRON YIELD SPECTRA AND OPTIMIZATION OF PHOTON GLANCING ANGLE
MARTENS, G
RABE, P
SCHWENTNER, N
WERNER, A
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (14): : 3125 - 3133
[9] THE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE IN THE REFLECTIVITY AT THE K EDGE OF CU
MARTENS, G
RABE, P
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (10): : 1523 - 1534
[10] ENERGY-DEPENDENCE OF ELECTRON INELASTIC-SCATTERING MEAN-FREE-PATHS USING SYNCHROTRON RADIATION PHOTOELECTRON-SPECTROSCOPY
NORMAN, D
WOODRUFF, DP
[J]. SURFACE SCIENCE, 1978, 75 (02) : 179 - 198

← 1 2 →