THE X-RAY-INTERFEROMETER FOR HIGH-RESOLUTION MEASUREMENT OF ANOMALOUS DISPERSION AT HASYLAB

被引：11

作者：

BONSE, U

HARTMANNLOTSCH, I

LOTSCH, H

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91190-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：603 / 604

页数：2

共 6 条

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BONSE, U
MATERLIK, G
[J]. ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1976, 24 (02): : 189 - 191
[3] MEASUREMENT OF K-EDGE DISPERSION ANOMALIES WITH THE NEW X-RAY INTERFEROMETER AT DORIS
BONSE, U
SPIEKER, P
HEIN, JT
MATERLIK, G
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 172 (1-2): : 223 - 226
[4] BONSE U, Z PHYSIK B
[5] CUSATIS C, 1975, ANAMOLOUS SCATTERING
[6] APPLICATION OF THE DISPERSION-RELATION TO DETERMINE THE ANOMALOUS SCATTERING FACTORS
KAWAMURA, T
FUKAMACHI, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 224 - 226