FINITE-SIZE EFFECTS IN THE LOW-TEMPERATURE RESISTIVITY OF CUCR FILMS

被引:51
作者
DITUSA, JF [1 ]
LIN, K [1 ]
PARK, M [1 ]
ISAACSON, MS [1 ]
PARPIA, JM [1 ]
机构
[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853
关键词
D O I
10.1103/PhysRevLett.68.678
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The effect of finite sample size on the Kondo resistance anomaly has been explored in the CuCr system. The resistivity of thin CuCr films was studied as a function of width from 0.5 to 20 K. The magnitude of the Kondo anomaly is significantly depressed as the film width is reduced below 10-mu-m. This length scale is consistent with the radius of the electron-spin correlation cloud, suggesting a crossover from two- to one-dimensional behavior. A concurrent decrease in the temperature of the resistivity maximum suggests a diminished interimpurity interaction strength.
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页码:678 / 681
页数:4
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